Press Release - JUNE 04, 2019

AM Best Associate Director to Join Insurtech-Focused Panel at Insurance Technology Event in New York City

 Christopher Sharkey
Manager, Public Relations
+1 908 439 2200, ext. 5159

Jim Peavy
Director, Public Relations
+1 908 439 2200, ext. 5644


OLDWICK - JUNE 04, 2019
AM Best will participate in a panel discussion on next-level developments regarding insurtech’s collaboration with the insurance industry at InsiderTech New York, which will take place June 13, 2019, at the Convene location in New York City, NY.

Maura McGuigan, associate director, credit rating criteria—research & analytics, will speak at the Insurance Insider-hosted event on a panel session, titled, “InsurTech: Phase 2.” The panel discussion will focus on the relationship between insurtech and innovation. The event will bring together insurance expertise with leading figures in the start-up and venture capital investment fields and is timely as technology is a leading driver in the evolution of insurance companies’ cultures and their ability to meet changing market needs.

Historically, AM Best has indirectly captured innovation through the various building blocks of its rating process. With the recent release of a draft criteria, titled, “Scoring and Assessing Innovation,” AM Best will explicitly consider a company’s innovation efforts within its business profile building block to determine if the efforts have had a demonstrable positive or negative impact on its long-term financial strength.

Following the release of the finalized criteria, AM Best expects that all rated companies eventually will be scored and assigned a published innovation score. To learn more about the Insurance Insider event, please view the event overview. AM Best is a media sponsor for the event.

AM Best is a trusted source of insurance market insight and data, and the only global credit rating agency with a unique focus on the insurance industry. Best’s Credit Ratings are a recognized indicator of insurer financial strength and creditworthiness.